Hard x-ray full field nano-imaging of bone and nanowires at SSRL

AIP Conference Proceedings

Volumn 1234, Issue , 2010, Pages 79-82

  Andrews, Joy C ^a   Pianetta, Piero ^a   Meirer, Florian ^b   Chen, Jie ^c   Almeida, Eduardo ^d   Van Der Meulen, Marjolein C H ^e   Alwood, Joshua S ^f   Lee, Cathy ^g   Zhu, Jia ^h   Cui, Yi ^h  

^a SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^b TU WIEN   (Austria)

^c UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

^d NASA AMES RESEARCH CENTER   (United States)

^e School of Operations Research and Industrial Engineering   (United States)

^f Department of Aeronautics and Astronautics Department of Mechanical Engineering and Industrial for Computational and Mathematical Engineering   (United States)

^g SAN JOSE STATE UNIVERSITY   (United States)

^h Stanford University   (United States)

Author keywords

bone; nanowires; trabecula; X ray Microscopy

Indexed keywords

EID: 77955043613     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3463334     Document Type: Conference Paper

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