Submicrometer single crystal diffractometry for highly accurate structure determination

AIP Conference Proceedings

Volumn 1234, Issue , 2010, Pages 147-150

  Yasuda, Nobuhiro ^a,b   Fukuyama, Yoshimitsu ^a,b   Toriumi, Koshiro ^b,c   Kimura, Shigeru ^a,b   Takata, Masaki ^a,b,d  

^a JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c UNIVERSITY OF HYOGO   (Japan)

^d Harima Institute ^*  (Japan)

Author keywords

focused X ray beam; phase zone plate; single crystal structure analysis; structure factor; X ray diffraction

Indexed keywords

EID: 77955031637     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3463161     Document Type: Conference Paper

References (7)

1. S. Kimura, Y. Moritomo, Y. Tanaka, H. Tanaka, K. Toriumi, K. Kato, N. Yasuda, Y. Fukuyama, J. E. Kim, H. Murayama and M. Takata, AIP Conference Proceedings 879, 1238-1241 (2007).
2. Y. Fukuyama, N. Yasuda, J. E. Kim, H. Murayama, Y. Tanaka, S. Kimura, K. Kato, S. Kohara, Y. Moritomo, T. Matsunaga, R. Kojima, N. Yamada, H. Tanaka, T. Ohshima and M. Takata, Appl. Phys. Express 1, 045001 (2008).
3. Y. Tanaka, Y. Fukuyama, N. Yasuda, J. E. Kim, H. Murayama, S. Kohara, H. Osawa, T. Nakagawa, S. Kimura, K. Kato, F. Yoshida, H. Kamioka, Y. Moritomo, T. Matsunaga, R. Kojima, N. Yamada, K. Toriumi, T. Ohshima, H. Tanaka and M. Takata, Jpn. J. Appl. Phys. 48, 03A001 (2009).
4. N. Yasuda, H. Murayama, Y. Fukuyama, J.E. Kim, S. Kimura, K. Toriumi, Y. Tanaka, Y. Moritomo, Y. Kuroiwa, K. Kato, H. Tanaka and M. Takata, J. Synchrotron Rad. 16, 352-357 (2009).
5. T. Saka and N. Kato, Acta Cryst. A42, 469-478 (1986).
6. C. Giacovazzo, Fundamentals of Crystallography, Oxford University Press, New York (2002).
7. G. M. Sheldrick, Acta Cryst. A64, 112-122 (2008).