X-ray diffractometry for the structure determination of a submicrometre single powder grain

Journal of Synchrotron Radiation

Volumn 16, Issue 3, 2009, Pages 352-357

  Yasuda, Nobuhiro ^a,b   Murayama, Haruno ^c   Fukuyama, Yoshimitsu ^a,b   Kim, Jungeun ^a,b   Kimura, Shigeru ^a,b   Toriumi, Koshiro ^b,d   Tanaka, Yoshihito ^b,e   Moritomo, Yutaka ^b,f   Kuroiwa, Yoshihiro ^b,g   Kato, Kenichi ^b,e   Tanaka, Hitoshi ^b,e   Takata, Masaki ^a,b,e,h  

^a JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c CHUO UNIVERSITY   (Japan)

^d UNIVERSITY OF HYOGO   (Japan)

^e RIKEN SPring 8 Center   (Japan)

^f UNIVERSITY OF TSUKUBA   (Japan)

^g HIROSHIMA UNIVERSITY   (Japan)

^h UNIVERSITY OF TOKYO   (Japan)

Author keywords

Phase zone plate; Powder diffraction; Single crystal structure analysis; Submicrometre X ray beam; X ray diffraction

Indexed keywords

AXIS CONTROLS; BEAM LINES; DESIGN CONCEPTS; DIFFRACTION DATUM; DIFFRACTION INTENSITIES; HIGH PRECISION; PHASE ZONE PLATE; POSITIONING STAGES; POWDER DIFFRACTION; POWDER GRAINS; POWDER SAMPLES; SINGLE GRAINS; SINGLE-CRYSTAL STRUCTURE ANALYSIS; SPRING-8; STRUCTURE ANALYSIS; STRUCTURE DETERMINATIONS; SUBMICROMETRE X-RAY BEAM; UNDULATOR; X-RAY DIFFRACTOMETRY;

BARIUM TITANATE; DIFFRACTION; DIFFRACTOMETERS; ELECTROMAGNETIC WAVES; HOLOGRAPHIC INTERFEROMETRY; IMAGE RESOLUTION; PLATES (STRUCTURAL COMPONENTS); POWDERS; SYNCHROTRON RADIATION; SYNCHROTRONS; THICKNESS MEASUREMENT; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; X RAYS;

CRYSTAL STRUCTURE;

NANOMATERIAL;

ARTICLE; CHEMISTRY; COMPUTER AIDED DESIGN; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; INSTRUMENTATION; NANOTECHNOLOGY; POWDER; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; ULTRASTRUCTURE; X RAY DIFFRACTION;

COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; NANOSTRUCTURES; NANOTECHNOLOGY; POWDERS; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; X-RAY DIFFRACTION;

EID: 65549142251     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S090904950900675X     Document Type: Article

References (14)

1. Aoyagi, S., Kuroiwa, Y., Sawada, A., Yamashita, I. & Atake, T. (2002). J. Phys. Soc. Jpn, 71, 1218-1221.
2. David, W. I. F. & Shankiand, K. (2008). Acta Cryst. A64, 52-64.
3. David, W. I. F, Shankiand, K., McCusker, L. B. & Baerlocher, Ch. (2002). Editors. Structure Determination from Powder Diffraction Data, pp. 1-11. Oxford University Press.
4. Fukuyarna, Y., Yasuda, N., Kirn, J. E., Murayama, H., Ohshima, T., Tanaka, Y., Kimura, S., Kamioka, H, Moritomo, Y., Toriumi, K, Tanaka, H, Kato, K, Ishikawa, T. & Takata, M. (2008a). Rev. Set Instrum. 79, 045107.
5. Fukuyarna, Y., Yasuda, N., Kim, J. E., Murayama, H., Tanaka, Y., Kimura, S., Kato, K., Kohara, S., Moritomo, Y, Matsunaga, T., Kojima, R., Yamada, N., Tanaka, H., Ohshima, T. & Takata, M. (2008A). Appl. Phys. Express, 1, 045001.
6. Inoue, K., Oka, T., Suzuki, T., Yagi, N., Takeshita, K., Goto, S. & Ishikawa, T. (2001). Nucl. Instrum. Methods Phys. Res. A, 467-468, 674-677.
7. Kimura, S., Moritomo, Y., Tanaka, Y, Tanaka, H, Toriumi, K., Kato, K., Yasuda, N., Fukuyarna, Y., Kim, J. E., Murayama, H. & Takata, M. (2007). ATP Conf. Proc. 879, 1238-1241.
8. Ohsumi, K., Hagiya, K. & Ohmasa, M. (1991). J. AppL Crvst. 24,340-348.
9. Ozawa, A., Tamamura, X, Ishii, T., Yoshihara, H. & Kagoshima, Y. (1997). Microelectron. Eng. 35, 525-529.
10. Riekel, C, Burgliammer, M. & Schertier, G. (2005). Curr. Opin. Struct. Biol. 15, 556-562.
11. Rigaku Corporation (1998). RAPID-AUTO. Rigaku Corporation, Tokyo, Japan.
12. Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.
13. Volkringer, C, Popov, D., Loiseau, T., Guillou, N., Ferey, G., Haouas, M., Taulelle, F, Mellot-Draznieks, C, Burghammer, M. & Riekel, C. (2007). Nat. Mater. 6, 760-764.
14. Yashima, M., Hoshina, T., Ishimura, D., Kobayashi, S., Nakaniura, W., Tsurumi, T. & Wada, S. (2005). J. AppL Phys. 98, 014313.