Measuring the source brilliance at an undulator beamline

AIP Conference Proceedings

Volumn 1234, Issue , 2010, Pages 603-606

  Zontone, Federico ^a   Madsen, Anders ^a   Konovalov, Oleg ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

amorphous materials; brilliance; scintillation detectors; Synchrotron sources; X ray scattering

Indexed keywords

EID: 77955025597     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3463279     Document Type: Conference Paper

References (15)

1. O. Chubar and P. Ellaume, Synchrotron Radiation Workshop (SRW) code, http://www.esrf.fr/Accelerators/Groups/InsertionDevices/Software/SRW
2. Z. Cai et al, Rev. Sci. Instr. 67, 3348 (1996).
3. S. D. Shastri, R. J. Dejus and D. R. Haeffner, J. Sync. Rad. 5, 67 (1998).
4. T. Hara et al., Rev. Sci. Instr. 73, 1125 (2002).
5. J. Als-Nielsen and K. Kjaer, Nucl. Inst. Meth. A323, 686 (1992).
6. http://www.esrf.fr/UsersAndScience/Experiments/SoftMatter/ID10A/
7. G. Grübel, A. Madsen, and A. Robert, "X-ray Photon Correlation Spectroscopy", ch. 18 in Soft Matter Scattering, Imaging and Manipulation, edited by R. Borsali & R. Pecora, Springer (2008), pp. 954-995.
8. I. K. Robinson and R. Harder, Nature Materials 8, 291 (2009).
9. E. Lima, L. Wiegart, P. Pernot, M. Howells, F. Zontone, and A. Madsen, Phys. Rev. Lett., Accepted (2009).
10. M. Mattenet, F. Zontone, A. Madsen, Proceedings of the MEDSI-SRI2008 conference papers (2009, to be published).
11. A. Madsen, J. Als-Nielsen, F. Zontone and G. Grübel, Proceedings of the 8th International Conference on Synchrotron Radiation Instrumentation, San Francisco, CA, AIP Conference Proceedings 705, 2004, p. 993-996.
12. http://www.esrf.fr/UsersAndScience/Experiments/SoftMatter/ID10B/.
13. B. E. Warren, "X-ray Diffraction" Addison-Wesley, Reading MA, 1969.
14. b9).
15. F. Zontone, A. Madsen and O. Konovalov, in preparation.