Thermal and electronic properties of macroscopic multi-walled carbon nanotubes blocks

Journal of Nanoscience and Nanotechnology

Volumn 10, Issue 6, 2010, Pages 3828-3833

  Castellino, M ^a   Tortello, M ^a   Bianco, S ^a   Musso, S ^a   Giorcelli, M ^a   Pavese, M ^a   Gonnelli, R S ^a   Tagliaferro, A ^a  

^a POLITECNICO DI TORINO   (Italy)

Author keywords

Annealing; Electrical characterization; Massive CNT carpet; Thermal characterization

Indexed keywords

ANNEALING PROCESS; AS-GROWN; BULK RESISTIVITY; CHEMICAL VAPOUR DEPOSITION; DIFFERENTIAL SCANNING CALORIMETERS; ELECTRICAL ANALYSIS; ELECTRICAL CHARACTERIZATION; ELECTRICAL PROPERTY; FOUR-PROBE TECHNIQUES; HEAT TRANSPORT PROPERTY; HIGH TEMPERATURE BEHAVIOR; LASER FLASH TECHNIQUES; LINEAR DEPENDENCE; MASSIVE CNT CARPET; MULTI-WALL CARBON NANOTUBES; SPECIFIC HEAT CAPACITY; SPECTROSCOPY MEASUREMENTS; SQUARE ROOTS; THERMAL CHARACTERIZATION; VERTICALLY ALIGNED;

ANNEALING; CARBON NANOTUBES; DIFFERENTIAL SCANNING CALORIMETRY; ELECTRIC PROPERTIES; ELECTRONIC PROPERTIES; SPECIFIC HEAT; TRANSPORT PROPERTIES;

MULTIWALLED CARBON NANOTUBES (MWCN);

EID: 77955002711     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2010.1973     Document Type: Article

References (36)

1. M. Kosaka, T. W. Ebbesen, H. H. Hiura, and K. Tanigaki, Chem. Phys. Lett. 233, 47 (1995).
2. S. Musso, M. Giorcelli, M. Pavese, S. Bianco, M. Rovere, and A. Tagliaferro, Diam. Rel. Mater. 17, 542 (2008).
3. M. Endo, Y. A. Kim, Y. Fukai, T. Hayashi, M. Terrones, and H. Terrones, Appl. Phys Lett. 79, 1531 (2001).
4. Y. A. Kim, T. Hayashi, M. Endo, Y. Kaburagi, T. Tsukada, J. Shan, K. Osato, and S. Tsuruoka, Carbon 43, 2243 (2005).
5. S. Musso, S. Porro, M. Rovere, A. Chiodoni, and A. Tagliaferro, Diam. Rel. Mater. 16, 1147 (2007).
6. M. Meyyappan, Carbon Nanotubes: Science and Applications, CRC Press, USA (2005).
7. L. X. Benedict, S. G. Louie, and M. L. Cohen, Solid State Comm. 100, 177 (1996).
8. J. J. Romero, IEEE Spectrum 12, 12 (2007).
9. W. J. Parker, R. J. Jenkins, C. P. Butler, and G. L. Abbott, J. Appl. Phys. 32, 1679 (1961).
10. M. Kumar and Y. Ando, Diam. Rel. Mater. 12, 1845 (2003).
11. S. Musso, S. Porro, M. Giorcelli, A. Chiodoni, C. Ricciardi, and A. Tagliaferro, Carbon/Letters to the Editor 45, 1133 (2007).
12. S. Musso, S. Porro, M. Rovere, M. Giorcelli, and A. Tagliaferro, J. Cryst. Growth 310, 477 (2008).
13. B. Wei, R. Spolenak, P. Kohler-Redlich, M. Ruhle, and E. Arzt, Appl. Phys. Lett. 74, 3149 (1999).
14. M. Tsai, C. Yu, C. Yang, N. Tai, T. Perng, C. Tu, Z. H. Khan, Y. Liao, and C. Chi, Appl. Phys. Lett. 89, 192115 (2006).
15. B. L. Altshuler and A. G. Aronov, Sov. Phys. JETP 50, 968 (1979).
16. R. Jin, Z. X. Zhou, D. Mandrus, I. N. Ivanov, G. Eres, J. Y. Howe, A. A. Puretzky, and D. B. Geohegan, Physica B 388, 326 (2007).
17. S. Gupta, R. J. Patel, N. Smith, R. E. Giedd, and D. Hui, Diam. Rel. Mater. 16, 236 (2007).
18. P. Castrucci, M. Scarselli, M. De Crescenzi, M. A. El Khakani, F. Rosei, N. Braidy, and J.-H. Yi, Appl. Phys. Lett. 85, 3857 (2004).
19. A. Hassanien and M. Tokumoto, Carbon 42, 2649 (2004).
20. M. Terrones, A. Jorio, M. Endo, A. M. Rao, Y. A. Kim, T. Hayashi, H. Terrones, J.-C. Charlier, G. Dresselhaus, and M. S. Dresselhaus, Mater. Today 1369, 30 (2004).
21. A. Mizel, L. X. Benedict, M. L. Cohen, S. G. Louie, A. Z. Nasser, K. Budraa, and W. P. Beyermann, Phys. Rev. B 60, 3264 (1999).
22. C. Masarapu, L. L. Henry, and B. Wei, Nanoteeh. 16, 1490 (2005).
23. N. Mounet and N. Marzari, Phys. Rev. B71, 205214 (2005).
24. L. E. Fried and W. M. Howard, Phys. Rev. B 61, 8734 (2000).
25. P. Debye, Ann. d. Phys. 39, 789 (1921).
26. F. A. Miller and B. L. Crawford, J. Chem. Phys. 14, 282 (1946).
27. J. A. Young and J. U. Koppel, J. Chem. Phys. 42, 357 (1965).
28. K. Komatsu and T. Nagamiya, JPSJ 6, 438 (1951).
29. K. Komatsu, J. Phys. Chem. Solids 6, 380 (1958).
30. K. Komatsu, J. Phys. Chem. Solids 25, 707 (1964).
31. K. Komatsu and T. Nagamiya, JPSJ 10, 346 (1955).
32. J. Hone, Topics Appl. Phys. 80, 273 (2001).
33. S. Rols, Z. Benes, E. Anglaret, J. L. Sauvajol, P. Papanek, J. E. Fischer, G. Coddens, H. Schober, and A. J. Dianoux, Phys. Rev. Lett. 85, 5222 (2000).
34. J. Hou, X. Wang, C. Liu, and H. Cheng, Appl. Phys. Lett. 88, 181910 (2006).
35. H. Xie, A. Cai, and X. Wang, Phys. Lett. A 369, 120 (2007).
36. P. Kim, L. Shi, A. Majumdar, and P. L. McEuen, Phys. Rev. Lett. 21, 215502 (2001).