An improved dual-probe approach to measure noise source impedance

2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010

Volumn , Issue , 2010, Pages 214-217

  Bo, Zhao ^a   Min, Zhao ^a   Zhiming, Feng ^b   Limin, Shui ^b   Min, Yao ^b  

^a NANJING UNIVERSITY OF AERONAUTICS AND ASTRONAUTICS   (China)

^b Jiangsu Institute of Metrology   (China)

Author keywords

Dual probe approach; Electromagnetic interference (EMI); Noise source impedance

Indexed keywords

CONDUCTED EMI; ELECTROMAGNETIC INTERFERENCE; HIGH FREQUENCY; IMPEDANCE METHOD; NOISE SOURCE; NOISE SOURCE IMPEDANCE; SOURCE IMPEDANCE; SWITCHED MODE POWER SUPPLIES;

ELECTRIC INVERTERS; ELECTROMAGNETIC COMPATIBILITY; ELECTROMAGNETIC PULSE; ELECTROMAGNETIC WAVE INTERFERENCE; ELECTROMAGNETISM; MAGNETIC MATERIALS; MEASUREMENT ERRORS; PROBES; SHAPE MEMORY EFFECT; SIGNAL INTERFERENCE;

ACOUSTIC NOISE;

EID: 77954990800     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/APEMC.2010.5475573     Document Type: Conference Paper

References (7)

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