High-temperature poly(phthalazinone ether ketone) thin films for dielectric energy storage

ACS Applied Materials and Interfaces

Volumn 2, Issue 5, 2010, Pages 1286-1289

  Pan, Jilin ^a,b   Li, Kun ^c   Chuayprakong, Sunanta ^a   Hsu, Tim ^c   Wang, Qing ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b SICHUAN UNIVERSITY   (China)

^c Polymics Ltd   (United States)

Author keywords

Breakdown strength; Capacitors; Dielectric properties; Energy density; High temperature materials; Polymers

Indexed keywords

ANGULAR FREQUENCIES; BREAKDOWN FIELD; BREAKDOWN STRENGTH; BREAKDOWN STRENGTHS; CONDUCTION PROCESS; DISCHARGE TIME; ELECTRIC ENERGIES; ENERGY DENSITY; FAST DISCHARGES; HIGH TEMPERATURE; HIGH-TEMPERATURE MATERIALS; LINEAR CORRELATION; POLY (PHTHALAZINONE ETHER KETONE); SYNTHESIS AND CHARACTERIZATION; TEMPERATURE RANGE;

CAPACITANCE; CAPACITORS; DIELECTRIC LOSSES; ELECTRIC BREAKDOWN; ENERGY STORAGE; ETHERS; FLYWHEELS; KETONES; POLYMERS; SYNTHESIS (CHEMICAL);

DIELECTRIC MATERIALS;

KETONE; MACROGOL DERIVATIVE; POLYETHERETHERKETONE;

ARTIFICIAL MEMBRANE; CHEMISTRY; ELECTRIC CAPACITANCE; ENERGY TRANSFER; LETTER; MATERIALS TESTING; TEMPERATURE;

ELECTRIC CAPACITANCE; ENERGY TRANSFER; KETONES; MATERIALS TESTING; MEMBRANES, ARTIFICIAL; POLYETHYLENE GLYCOLS; TEMPERATURE;

EID: 77954972706     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am100146u     Document Type: Article

References (21)

1. Rabuffi, M. and Picci, G. IEEE Trans. Plasma Sci. 2002, 30, 1939
2. Cao, Y., Irwin, P. C., and Younsi, K. IEEE Trans. Dielect. Elect. Insul. 2004, 11, 797
3. Chu, B., Zhou, X., Ren, K., Neese, B., Lin, M., Wang, Q., Bauer, F., and Zhang, Q. M. Science 2006, 313, 334
4. Lu, Y., Claude, J., Neese, B., Zhang, Q. M., and Wang, Q. J. Am. Chem. Soc. 2006, 128, 812
5. Sarjeant, W. J., Zimheld, J., and MacDougall, F. W. IEEE Trans. Plasma Sci. 1998, 26, 1368
6. Jain, P. and Pymaszewski, E. J. Thin Film Capacitors for Packaged Electronics; Kluwer: Norwell, MA, 2003.
7. Grzybowski, R. R. and Mccluskey, F. P. Int. J. Microelectron. Packag. 1998, 1, 153
8. Suthar, J. L. and Laghari, J. R. J. Mater. Sci. 1992, 27, 1795
9. Venkatasubramanian, N., Wiacek, K. J., Fries-Carr, S., Fossum, E., and Dang, T. D. Polyimides Other High Temp. Polym. 2007, 4, 393
10. Irwin, P. C., Tan, D. Q., Cao, Y., Silvi, N., Carter, M., Rumler, M., and Garet, C. SAE Int. J. Aerosp. 2008, 1, 817
11. Pan, J., Li, K., Li, J., Hsu, T., and Wang, Q. Appl. Phys. Lett. 2009, 95 022902
12. Hay, A. S. and Jian, X. U.S. Pat. Appl. Publ. 2007238853, 2007.
13. Berard, N., Paventi, M., Chan, K. P., and Hay, A. S. Macromol. Symp. 1994, 77, 379
14. Guo, M., Yang, X., and Goodson, T. Adv. Mater. 2008, 20, 4167
15. Lu, Y., Claude, J., Norena-Franco, L. E., and Wang, Q. J. Phys. Chem. B 2008, 112, 10411
16. Chen, Q., Wang, Y., Zhou, X., Zhang, Q. M., and Zhang, S. Appl. Phys. Lett. 2008, 92, 142909
17. Kao, K. C. Dielectric Phenomena in Solids; Academic Press: New York, 2004.
18. Aboelfotoh, M. O. and Feger, C. Phys. Rev. B 1993, 47, 13395
19. Claude, J., Lu, Y., and Wang, Q. Appl. Phys. Lett. 2007, 91, 212904
20. Suthar, J. L. and Laghari, J. R. J. Mater. Sci.: Mater. Electron. 1992, 3, 77
21. Yoshino, K., Yun, M. S., Ozaki, M., Kim, S. H., Inuishi, Y., and Kyokane, J. Jpn. J. Appl. Phys. 1983, 22, 1510