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Volumn 92, Issue 14, 2008, Pages

High field tunneling as a limiting factor of maximum energy density in dielectric energy storage capacitors

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; ELECTRIC BREAKDOWN; ELECTRIC CURRENTS; ELECTRIC FIELD EFFECTS; ENERGY EFFICIENCY; ENERGY STORAGE;

EID: 42149114575     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2903115     Document Type: Article
Times cited : (117)

References (22)
  • 14
    • 0024179899 scopus 로고
    • Proceedings of the Second International Conference on Properties and Applications of Dielectric Materials, (unpublished), Vol.
    • H. Zhao, D. Tu, and Y. Liu, Proceedings of the Second International Conference on Properties and Applications of Dielectric Materials, 1988 (unpublished), Vol. 2, pp. 423-425.
    • (1988) , vol.2 , pp. 423-425
    • Zhao, H.1    Tu, D.2    Liu, Y.3
  • 16
    • 84891308980 scopus 로고    scopus 로고
    • Dielectric Phenomena in Solids (Academic, New York)
    • K. C. Kao, Dielectric Phenomena in Solids (Academic, New York, 2004), pp. 327-378.
    • (2004) , pp. 327-378
    • Kao, K.C.1
  • 18
    • 42149158774 scopus 로고
    • Physics of Semiconductor Devices, 2nd ed. (Wiley, New York)
    • S. M. Sze, Physics of Semiconductor Devices, 2nd ed. (Wiley, New York, 1981), pp. 403.
    • (1981) , pp. 403
    • Sze, S.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.