Characterization of bending losses for curved plasmonic nanowire waveguides

Optics Express

Volumn 18, Issue 15, 2010, Pages 16112-16119

  Dikken, Dirk Jan ^a   Spasenović, Marko ^a   Verhagen, Ewold ^a   Van Oosten, Dries ^a   Kuipers, L ^a  

^a FOM INSTITUTE AMOLF   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

FINITE DIFFERENCE TIME DOMAIN METHOD; MATHEMATICAL MODELS; NANOWIRES; PLASMONS; WAVEGUIDES;

ANALYTICAL MODEL; BENDING LOSS; CURVED WAVEGUIDES; FINITE DIFFERENCE TIME DOMAIN SIMULATIONS; NANOWIRE WAVEGUIDES; NEAR-FIELD MEASUREMENT; PROPAGATION LOSS; RADII OF CURVATURE; RADIUS OF CURVATURE;

ELECTRIC LOSSES;

EID: 77954942151     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.016112     Document Type: Article

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