Polarization effects on scatterer sizing accuracy analyzed with frequency-domain angle-resolved low-coherence interferometry

Applied Optics

Volumn 46, Issue 10, 2007, Pages 1735-1741

  Pyhtila, John W ^a   Wax, Adam ^a  

^a Duke University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FREQUENCY DOMAIN ANALYSIS; LIGHT SCATTERING; OPTICAL FIBERS; POLARIZATION; POLYSTYRENES; TISSUE;

DEPTH RESOLVED MEASUREMENTS; LOW COHERENCE INTERFEROMETRY; POLARIZATION EFFECTS; SCATTERER SIZING ACCURACY;

INTERFEROMETRY;

ALGORITHM; ARTICLE; ARTIFACT; COMPUTER ASSISTED DIAGNOSIS; EVALUATION; IMAGE ENHANCEMENT; METHODOLOGY; OPTICAL COHERENCE TOMOGRAPHY; PARTICLE SIZE; PHASE CONTRAST MICROSCOPY; POLARIZATION MICROSCOPY; RADIATION SCATTERING; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; THREE DIMENSIONAL IMAGING;

ALGORITHMS; ARTIFACTS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; IMAGING, THREE-DIMENSIONAL; MICROSCOPY, INTERFERENCE; MICROSCOPY, POLARIZATION; PARTICLE SIZE; REPRODUCIBILITY OF RESULTS; SCATTERING, RADIATION; SENSITIVITY AND SPECIFICITY; TOMOGRAPHY, OPTICAL COHERENCE;

EID: 34247498782     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.46.001735     Document Type: Conference Paper

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