Physical and chemical modifications of PET surface using a laser-plasma EUV source

Applied Physics A: Materials Science and Processing

Volumn 99, Issue 4, 2010, Pages 831-836

  Bartnik, A ^a   Fiedorowicz, H ^a   Jarocki, R ^a   Kostecki, J ^a   Szczurek, M ^a   Bilinski A ^b   Chernyayeva, O ^b   Sobczak, J W ^b  

^a MILITARY UNIVERSITY OF TECHNOLOGY   (Poland)

^b INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL STRUCTURE; CHEMICAL SURFACES; ELECTROMAGNETIC RADIATION; EUV SOURCE; EXTREME ULTRAVIOLET RADIATIONS; FLUENCES; GAS-PUFF TARGET; IRRADIATED SAMPLES; KRYPTON PLASMA; LASER PLASMA; PENETRATION DEPTH; POLYMER SAMPLES; REPETITION RATE; SCANNING ELECTRON MICROSCOPE; SINGLE PULSE; SOFT X-RAY; SURFACE MICROSTRUCTURES; SURFACE MODIFICATION; VACUUM ULTRAVIOLETS; WAVELENGTH RANGES; XPS MEASUREMENTS;

CHEMICAL MODIFICATION; ELECTROMAGNETIC WAVES; ELECTRON OPTICS; EXTREME ULTRAVIOLET LITHOGRAPHY; KRYPTON; LASER PRODUCED PLASMAS; LIGHT SOURCES; MORPHOLOGY; PHOTONS; PLASMA INTERACTIONS; POLYETHYLENE TEREPHTHALATES; SCANNING ELECTRON MICROSCOPY; STRUCTURE (COMPOSITION); SURFACES; THERMOPLASTICS; ULTRAVIOLET DEVICES; ULTRAVIOLET LASERS; X RAY PHOTOELECTRON SPECTROSCOPY;

SURFACE MORPHOLOGY;

EID: 77954887420     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-010-5596-1     Document Type: Article

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