|
Volumn 45, Issue 15, 2010, Pages 4088-4092
|
Controlled synthesis and structural characterization of polycrystalline GaSe
|
Author keywords
[No Author keywords available]
|
Indexed keywords
COMPONENT ELEMENTS;
COMPREHENSIVE STUDIES;
CONTROLLED SYNTHESIS;
GALLIUM SELENIDES;
HEXAGONAL SYSTEMS;
POLYCRYSTALLINE;
QUARTZ AMPOULE;
SPECTRAL STUDIES;
STRUCTURAL CHARACTERIZATION;
SYNTHESIS AND CHARACTERIZATION;
X RAY DIFFRACTOMETRY;
GALLIUM;
OXIDE MINERALS;
QUARTZ;
SPECTROSCOPIC ANALYSIS;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
SCANNING ELECTRON MICROSCOPY;
|
EID: 77954861494
PISSN: 00222461
EISSN: 15734803
Source Type: Journal
DOI: 10.1007/s10853-010-4496-2 Document Type: Article |
Times cited : (17)
|
References (12)
|