17.3: Work function reduction by multilayer oxides: Thermionic electron emission microscopy of scandium oxide and barium oxide on tungsten

2010 IEEE International Vacuum Electronics Conference, IVEC 2010

Volumn , Issue , 2010, Pages 421-422

  Vaughn, Joel M ^a   Jamison, Keith D ^b   Kordesch, Martin E ^a  

^a OHIO UNIVERSITY   (United States)

^b Nanohmics Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77954856085     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IVELEC.2010.5503437     Document Type: Conference Paper

References (4)

1. Vlahos, V., Lee, YL, Booske, J.H., Morgan, D, Turek, L.,Kirshner, M., Kowalczyk, R.,Wilsen, C., Appl. Phys. Lett., 84, 184102 (2009).
2. Prada, S., Martinez, U., Pacchioni, G., Phys. Rev. B, 78, 235423 (2008) DOI 10.1103/PhysRevB.78.235423.
3. Vaughn, J.M., Jamison, K.D. and Kordesch, M.E., IEEE Trans Elec. Dev., 56(5) 2009, 794-798.
4. Vaughn, J.M., Jamison, K.D., and Kordesch, M.E., IVEC 2010, "Thermionic Electron Emission Microscopy Comparison of Model Thin Film Scandate Cathode Surfaces."