Large-signal FET model with multiple time scale dynamics from nonlinear vector network analyzer data

IEEE MTT-S International Microwave Symposium Digest

Volumn , Issue , 2010, Pages 417-420

  Xu, Jianjun ^a   Hom, Jason ^a   Iwamoto, Masaya ^a   Root, David E ^a  

^a AGILENT TECHNOLOGIES   (United States)

Author keywords

Microwave FETs; Neural networks; Nonlinear vector network analyzer; Semiconductor device modeling

Indexed keywords

AGILENT; ARTIFICIAL NEURAL NETWORK; CONSTITUTIVE RELATIONS; CURRENT SOURCES; DRAIN LAG; GAAS; GATE LAG; LARGE-SIGNALS; MEASURED DATA; MICROWAVE FET; MULTIPLE TIME-SCALE DYNAMICS; NON-QUASI STATIC; NONLINEAR CIRCUIT; NONLINEAR VECTOR NETWORK ANALYZER; NONLINEAR VECTOR NETWORK ANALYZERS; SELF-HEATING; SEMICONDUCTOR DEVICE MODELING; TERMINAL VOLTAGES; TRAP STATE; TRAPPING DYNAMICS;

CIRCUIT SIMULATION; DRAIN CURRENT; GALLIUM ALLOYS; GALLIUM NITRIDE; MESFET DEVICES; MICROWAVES; NEURAL NETWORKS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR SWITCHES; VECTORS;

ELECTRIC NETWORK ANALYZERS;

EID: 77954780243     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSYM.2010.5516843     Document Type: Conference Paper

References (7)

1. th European Integrated Circuits Conference, Rome, September, 2009 pp 339-342.
2. A.M. Conway, and P. M. Asbeck, IEEE International Microwave Symposium, June, 2007 pp 605 - 608.
3. O. Jardel, F. D. Groote, T. Reveyrand, J.C. Jacquet, C. Charbonniaud, J. P. Teyssier, D. Floriot, and R. Quere, IEEE Trans. MIT., vol.55, pp. 2660-2669, 2007.
4. Q. J. Zhang and K. C. Gupta, Neural Networks for RF and Microwave Design, Norwood, MA: Artech House, 2000.
5. G. Simpson, J. Hom, D. Gunyan, and D.E. Root, IEEE ARFTG Conference, Portland, December, 2008 pp 88-91.
6. D. Gunyan, J. Hom, J. Xu, and D. E. Root, 73rd ARFTG Conference, Boston, June, 2009.
7. http://www.agilent.comlfind/nvna