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Volumn 36, Issue 3, 2010, Pages 411-417

Modeling and verification of embedded systems using timed colored Petri Net with inhibitor arcs

Author keywords

Embedded system; Inhibitor arc; Modeling; Petri net; Verification

Indexed keywords


EID: 77954662427     PISSN: 10063080     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (4)

References (10)
  • 1
    • 0344034677 scopus 로고    scopus 로고
    • Modeling and formal verification of embedded systems based on a Petri net representation
    • Cortes L A, Eles P, Peng Zebo. Modeling and formal verification of embedded systems based on a Petri net representation [Jj. Journal of Systems Architecture, 2003, 49(12-15):571-598.
    • (2003) Journal of Systems Architecture , vol.49 , Issue.12-15 , pp. 571-598
    • Cortes, L.A.1    Eles, P.2    Peng, Z.3
  • 2
    • 0024645936 scopus 로고
    • Petri nets: Properties, analysis and applications
    • Murata T. Petri nets: Properties, analysis and applications [J]. Proceedings of the IEEE, 1989, 77(4): 541-580.
    • (1989) Proceedings of the IEEE , vol.77 , Issue.4 , pp. 541-580
    • Murata, T.1
  • 4
    • 33244484081 scopus 로고    scopus 로고
    • A Petri net based model for heterogeneous embedded systems
    • Oslo, Norway. IEEE Press
    • Cortes L A, Eles P, Peng Zebo. A Petri net based model for heterogeneous embedded systems [Cl//17th IEEE NOR-CHIP Conference. Oslo, Norway. IEEE Press, 1999: 248-255.
    • (1999) 17th IEEE NOR-CHIP Conference , pp. 248-255
    • Cortes, L.A.1    Eles, P.2    Peng, Z.3
  • 5
    • 84893640625 scopus 로고    scopus 로고
    • Dual transitions Petri net based modeling technique for embedded systems specification
    • Munich, Germany: IEEE Computer Society
    • Varea M, Al-Hashimi B M. Dual transitions Petri net based modeling technique for embedded systems specification [CJ// Proceedings of the Conference on Design, Automation and Test in Europe. Munich, Germany: IEEE Computer Society, 2001 566-571.
    • (2001) Proceedings of the Conference on Design, Automation and Test in Europe , pp. 566-571
    • Varea, M.1    Al-Hashimi, B.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.