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Volumn 46, Issue 14, 2010, Pages 1025-1027

Charge dissipation layer based on conductive polymer for electron-beam patterning of bulk zinc oxide

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE DISSIPATION; CONDUCTIVE POLYMER; ELECTRON BEAM PATTERNING; HIGH-ENERGY ELECTRON; HIGH-RESOLUTION PATTERNS; HSQ RESIST; HYDROGEN SILSESQUIOXANE; POLY-THIOPHENE; PROCESSING METHOD; ZNO;

EID: 77954586089     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el.2010.1282     Document Type: Article
Times cited : (5)

References (7)
  • 3
    • 0035519514 scopus 로고    scopus 로고
    • Influence of sub-100nm scattering on high-energy electron beam lithography
    • Anderson, E.H., Olynick, D.L., Chao, W., Harteneck, B., and Veklerov, E.: ' Influence of sub-100nm scattering on high-energy electron beam lithography ', J. Vac. Sci. Technol. B, 2001, 19, (6), p. 2504-2507
    • (2001) J. Vac. Sci. Technol. B , vol.19 , Issue.6 , pp. 2504-2507
    • Anderson, E.H.1    Olynick, D.L.2    Chao, W.3    Harteneck, B.4    Veklerov, E.5
  • 4
    • 77954602212 scopus 로고    scopus 로고
    • Development of single-step and high-resolution ICP dry etching for a wide range of InP-based materials
    • Dylewicz, R., Hou, L., Mezösi, G., and Bryce, A.C.: ' Development of single-step and high-resolution ICP dry etching for a wide range of InP-based materials ', Compound Semicond. Mag., 2009, 15, (6), p. 34-36
    • (2009) Compound Semicond. Mag. , vol.15 , Issue.6 , pp. 34-36
    • Dylewicz, R.1    Hou, L.2    Mezösi, G.3    Bryce, A.C.4
  • 7
    • 33846963828 scopus 로고    scopus 로고
    • High-resolution electron beam lithography for the fabrication of high-density dielectric metamaterials
    • 10.1016/j.tsf.2006.09.011 0040-6090
    • Zhang, W., Potts, A., Bagnall, D.M., and Davidson, B.R.: ' High-resolution electron beam lithography for the fabrication of high-density dielectric metamaterials ', Thin Solid Films, 2007, 515, (7-8), p. 3714-3717 10.1016/j.tsf.2006.09.011 0040-6090
    • (2007) Thin Solid Films , vol.515 , Issue.78 , pp. 3714-3717
    • Zhang, W.1    Potts, A.2    Bagnall, D.M.3    Davidson, B.R.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.