Landmark placement for wireless localization in rectangular-shaped industrial facilities

IEEE Transactions on Vehicular Technology

Volumn 59, Issue 6, 2010, Pages 3081-3090

  Zhou, Junyi ^a   Shi, Jing ^a   Qu, Xiuli ^b  

^a North Dakota State University   (United States)

^b North Carolina Agricultural and Technical State University   (United States)

Author keywords

CramerRao lower bound (CRLB); landmark layout; localization; metric

Indexed keywords

ACTIVE RFID; ANALYTICAL ANALYSIS; CRAMER-RAO LOWER BOUND; EMERGING TECHNOLOGIES; INDUSTRIAL FACILITIES; LANDMARK PLACEMENT; LOCALIZATION PERFORMANCE; NUMERICAL RESULTS; OPTIMAL LAYOUT; PERFORMANCE METRICS; STATISTICAL MODELS; WIRELESS LOCALIZATION;

NUMERICAL ANALYSIS; PRESSURE DROP; PROBABILITY DENSITY FUNCTION;

ASPECT RATIO;

EID: 77954580792     PISSN: 00189545     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVT.2010.2048765     Document Type: Article

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