Linear phase extraction in dual-grid moiré profilometry using sinusoidal liquid crystal line grids

AIP Conference Proceedings

Volumn 1236, Issue , 2010, Pages 419-422

  Dirckxa, Joris J J ^a   Aernoutsa, Jef ^a   Buytaerta, Jan A N ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

LCD; Moir ; Profilometry; Topography

Indexed keywords

EID: 77954568602     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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