Laser desorption ionization time-of-flight mass spectrometric study of binary As-Se glasses

Rapid Communications in Mass Spectrometry

Volumn 24, Issue 14, 2010, Pages 2000-2008

  Pangavhane, Sachinkumar Dagurao ^a   Němec, Petr ^b   Wagner, Tomáš ^b   Janča, Jan ^a   Havel, Josef ^a  

^a MASARYK UNIVERSITY   (Czech Republic)

^b UNIVERSITY OF PARDUBICE   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; DESORPTION; IONIZATION; LASER ABLATION; MASS SPECTROMETRY; NEGATIVE IONS; SELENIUM COMPOUNDS; THERMAL PLUMES; THIN FILMS;

DEPOSITION TECHNIQUE; INFORMATION CONCERNING; LASER DESORPTION; LASER DESORPTION/IONIZATION TIME OF FLIGHTS; MATERIAL SCIENCE; PLASMAS PLUMES; PROPERTY; SCIENCE APPLICATIONS; TECHNOLOGICAL APPLICATIONS; THIN-FILMS;

GLASS;

EID: 77954493977     PISSN: 09514198     EISSN: 10970231     Source Type: Journal    
DOI: 10.1002/rcm.4607     Document Type: Article

References (36)

1. Swiler DR, Varshneya AK. J. Non-Cryst. Solids 1990; 25: 250.
2. Lucovsky G. Mater. Res. Bull. 1969; 4: 505.
3. Manevich M, Lyubin V, Klebanov M, Broder J, Eisenberg NP, Dror R, Feigel A, Sfez B. J. Phys. Chem. Solids 2007; 68: 931.
4. Zakery A, Elliott SR. J. Non-Cryst. Solids 2003; 330: 1.
5. Iovu MS, Harea DV, Colomeico EP, Iovu MA, Ciorba VG. Proc. SPIE Int. Soc. Opt. Eng. 2007; 6785: 67851E.
6. Popescu M, Sava F, Lorinczi A. J. Non-Cryst. Solids 2006; 352: 1506.
7. Boolchand P, Chen P, Vempati U. J. Non-Cryst. Solids 2009; 355: 1773.
8. Mateleshko N, Mitsa V, Veres M, Koos M. Chalcogenide Lett. 2004; 1: 139.
9. Mateleshko N, Mitsa V, Veres M, Koos M. J. Optoelectron. Adv. Mater. 2005; 7: 991.
10. Mauro JC, Varshneya AK. J. Non-Cryst. Solids 2007; 353: 1226.
11. Wondraczek L, Mauro JC. J. Eur. Ceram. Soc. 2009; 29: 1227.
12. Saiter A, Saiter JM, Golovchak R, Shpotyuk M, Shpotyuk O. J. Phys.: Condens. Matter 2009; 21: 075105.
13. Bordovsky GA, Nemov SA, Anisimova NI, Dzemidko IA, Marchenko AV, Seregin PP. Semiconductors 2009; 43: 352.
14. Němec P, Nazabal V, Frumar M. J. Appl. Phys. 2009; 106: 023509.
15. Němec P, Jedelsky J, Frumar M, Stabl M, Cernosek Z. Thin Solid Films 2005; 484: 140.
16. Němec P, Frumar M. Thin Solid Films 2008; 516: 8377.
17. Trunov ML, Nagy PM, Takats V, Lytvyn PM, Kokenyesi S, Kalman E. J. Non-Cryst. Solids 2009; 355: 1993.
18. Němec P, Jedelský J, Frumar M, Stábl M, VÍcek M. J. Phys. Chem. Solids 2004; 65: 1253.
19. Hari P, Adair J, Tolk N, Sanghera J, Aggarwal I. J. Non-Cryst. Solids 2006; 352: 2430.
20. Focsa C, Němec P, Ziskind M, Ursu C, Gurlui S, Nazabal V. Appl. Surf. Sci. 2009; 255: 5307.
21. HouŠka J, Panyala NR, Peña-Méndez EM, Havel J. Rapid Commun. Mass Spectrom. 2009; 23: 1125.
22. HouŠka J, Penña-Méndez EM, Kolář J, Frumar M, Wágner T, Havel J.Rapid Commun. Mass Spectrom. 2009; 23: 1715.
23. Ramírez-Galicia G, Peña-Méndez EM Pangavhane SD, Alberti M, Havel J. Polyhedron 2010; in press.
24. Šedo O, Alberti M, Havel J. Polyhedron 2005; 24: 639.
25. Pangavhane SD, Houška J, Wa ́gner T, Pavlišta M, Janča J, Havel J. Rapid Commun. Mass Spectrom. 2010; 24: 95.
26. Sládková K, HouŠka J, Havel J.Rapid Commun. Mass Spectrom. 2009; 23: 3114.
27. Iovu MS, Kamitsos EI, Varsamis CPE, Boolchand P, Popescu M. J. Optoelectron. Adv. Mater. 2005; 7: 1217.
28. Ystenes M, Brockner W, Menzel F. Vibrational Spectroscopy 1993; 5: 195.
29. Ystenes M, Menzel F, Brockner W. Spectrochim. Acta 1994; 50A: 225.
30. Nagels P, Callaerts R, Roy M, Vlček M. J. Non-Cryst. Solids 1991; 137: 1001.
31. Frumar M, Frumarová B, Wágner T, Němec P. In Photo- Induced Metastability in Amorphous Semiconductors, Kolobov AV (ed). Wiley-VCH: Weinheim, 2003; 23.
32. Popescu M, Sava F, Lorinczi A. J. Non-Cryst. Solids 2006; 352: 1506.
33. Golovachak R, Shpotyuk O, Kozdras A, Bureau B, Vlček M, Ganjoo A, Jain H. Philos. Mag. 2007; 87: 4323.
34. Golovachak R, Kovalskíy A, Miller AC, Jaín H, Shpotyuk O. Phys. Rev. B 2007; 76: 125208.
35. Rosli AN, Abu Kassim H, Shrivastava KN. Current Issues of Physics in Malaysia 2008; 1017: 429.
36. Christian BH, Gillespie RJ, Sawyer JF. Inorg. Chem. 1981; 20: 3410.