Fundamental processes governing operation and degradation in state of the art P-OLEDs

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7722, Issue , 2010, Pages

  Roberts, Matthew ^a   Asada, Kohei ^b   Cass, Michael ^a   Coward, Chris ^a   King, Simon ^a   Lee, Andrew ^a   Pintani, Martina ^a   Ramon, Miguel ^a   Foden, Clare ^a  

^a Cambridge Display Technology Ltd   (United Kingdom)

^b SUMITOMO CHEMICAL CO LTD   (Japan)

Author keywords

Degradation; Device models; Efficiency; LED; Lifetime; Mobility; Polyfluorene; Polymer; Reversible

Indexed keywords

BI-LAYER; BLUE LIGHT EMITTING MATERIALS; CHARGE TRANSPORT; DEGRADATION MECHANISM; DEGRADATION STUDY; DEVICE MODELS; DEVICE OPERATIONS; DEVICE PARAMETERS; DIPOLE ORIENTATION; ELECTRICAL DEGRADATION; ELECTRICAL SIMULATION; EXCITON FORMATION; EXPERIMENTAL ANALYSIS; FLUORESCENCE QUENCHING; GLASS TRANSITION TEMPERATURE; INTERLAYER MATERIALS; KEY FACTORS; KEY MATERIALS; LED; LIFETIME; MODEL MATERIALS; OLED TECHNOLOGY; OPERATIONAL STABILITY; OPTIMUM LOCATION; PHENYLENEDIAMINES; PHOTON GENERATION; POLYFLUORENES; STATE OF THE ART;

DEGRADATION; EXCITONS; FLUORESCENCE; GLASS TRANSITION; LIGHT EMISSION; LIGHT EMITTING DIODES; ORGANIC LIGHT EMITTING DIODES (OLED); POLYMERS; QUENCHING;

ELECTRIC GENERATORS;

EID: 77954414508     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.853714     Document Type: Conference Paper

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