Controllable synthesis of TiO2 submicrospheres with smooth or rough surface

Chemistry Letters

Volumn 39, Issue 7, 2010, Pages 684-685

  Wu, Wei ^a   Xiao, Xiangheng ^a   Zhang, Shaofeng ^a   Zhou, Juan ^a   Ren, Feng ^a   Jiang, Changzhong ^a  

^a WUHAN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77954328316     PISSN: 03667022     EISSN: 13480715     Source Type: Journal    
DOI: 10.1246/cl.2010.684     Document Type: Article

References (16)

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12. hkl is the particle size parallel to the (hkl) plane, k is a geometrical constant with a typical value of 0.89 for a spherical particles, À is the wavelength of the radiation, ß is the full width at half maximum (FWHM) in radians, and 6 is the position of the diffraction peak.
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