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Volumn 100, Issue PART 5, 2008, Pages
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Atomic force microscopy manipulation with ultrasonic excitation
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
NANOMAGNETICS;
NANOPARTICLES;
NANOSTRUCTURES;
ULTRASONIC WAVES;
AFM CANTILEVERS;
CONTACT MODES;
FRICTIONAL PROPERTIES;
MAGNETIC NANO-PARTICLES;
NOVEL METHODS;
PARTICLE SURFACE;
ULTRASONIC EXCITATION;
ULTRASONIC VIBRATION;
ULTRASONIC EFFECTS;
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EID: 77954327063
PISSN: 17426588
EISSN: 17426596
Source Type: Conference Proceeding
DOI: 10.1088/1742-6596/100/5/052013 Document Type: Conference Paper |
Times cited : (5)
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References (14)
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