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Volumn 100, Issue PART 6, 2008, Pages
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Thermal induced structural changes of a-C and a-C:Ti films analyzed by NEXAFS and XPS
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
CARBIDES;
SEMICONDUCTOR DOPING;
TITANIUM;
X RAY PHOTOELECTRON SPECTROSCOPY;
CARBON;
NANOSCIENCE;
ANNEALING TEMPERATURES;
CARBON ATOMS;
CARBON K-EDGE;
CARBON PHASE;
CARBONYL FUNCTIONALITY;
OXYGEN CONTENT;
TI DIFFUSION;
XPS MEASUREMENTS;
CARBON FILMS;
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EID: 77954319008
PISSN: 17426588
EISSN: 17426596
Source Type: Conference Proceeding
DOI: 10.1088/1742-6596/100/6/062033 Document Type: Conference Paper |
Times cited : (17)
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References (14)
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