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Volumn 100, Issue PART 6, 2008, Pages

Thermal induced structural changes of a-C and a-C:Ti films analyzed by NEXAFS and XPS

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CARBIDES; SEMICONDUCTOR DOPING; TITANIUM; X RAY PHOTOELECTRON SPECTROSCOPY; CARBON; NANOSCIENCE;

EID: 77954319008     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/100/6/062033     Document Type: Conference Paper
Times cited : (17)

References (14)
  • 7
    • 77954344492 scopus 로고
    • Stöhr J NEXAFS Spectroscopy Springer: Berlin
    • Stöhr J NEXAFS Spectroscopy Springer: Berlin 1992 p 403
    • (1992) , pp. 403


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.