Microstructure of ZrNiSn-base half-heusler thermoelectric materials prepared by melt-spinning

Wuji Cailiao Xuebao/Journal of Inorganic Materials

Volumn 25, Issue 6, 2010, Pages 569-572

  Yu, Cui ^a   Zhu, Tie Jun ^a   Xiao, Kai ^a   Jin, Ji ^a   Shen, Jun Jie ^a   Yang, Sheng Hui ^a   Zhao, Xin Bing ^a  

^a ZHEJIANG UNIVERSITY   (China)

Author keywords

Grain sizes; Microstructure; Rapid solidification; ZrNiSn

Indexed keywords

BOUNDARY SCATTERING; CRYSTAL GRAINS; GRAIN SIZE; GRAIN SIZES; HALF-HEUSLER; LATTICE THERMAL CONDUCTIVITY; MELT-SPUN; PROPERTY MEASUREMENT; SCANNING ELECTRON MICROSCOPE; SINTERING PROCESS; THERMOELECTRIC MATERIAL; THIN RIBBONS; TRANSMISSION ELECTRON MICROSCOPE; XRD ANALYSIS;

CARRIER CONCENTRATION; CRYSTALLIZATION; ELECTRIC FURNACES; ELECTRON MICROSCOPES; GRAIN SIZE AND SHAPE; HAFNIUM; LEVITATION MELTING; MICROSTRUCTURE; NANOCRYSTALLINE ALLOYS; NANOCRYSTALS; SCANNING ELECTRON MICROSCOPY; SPARK PLASMA SINTERING; THERMOELECTRIC EQUIPMENT; THERMOELECTRICITY; TRANSMISSION ELECTRON MICROSCOPY; ZIRCONIUM;

RAPID SOLIDIFICATION;

EID: 77954308207     PISSN: 1000324X     EISSN: None     Source Type: Journal    
DOI: 10.3724/SP.J.1077.2010.00569     Document Type: Article

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