Amine species on self-assembled monolayers of ω-aminothiolates on gold as identified by XPS and NEXAFS spectroscopy

Surface and Interface Analysis

Volumn 42, Issue 6-7, 2010, Pages 1184-1187

  Dietrich, Paul M ^a   Graf, Nora ^a   Gross, Thomas ^a   Lippitz, Andreas ^a   Krakert, Simone ^b   Schüpbach, Björn ^b   Terfort, Andreas ^b   Unger, Wolfgang E S ^a  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^b GOETHE UNIVERSITY   (Germany)

Author keywords

Amines; NEXAFS; Self assembled monolayer; Surface analysis; XPS

Indexed keywords

4-AMINOBENZENETHIOL; ALKYL SPACERS; AMINO GROUP; AMINOTHIOLS; AROMATIC AMINES; AROMATIC MONOLAYERS; GOLD SUBSTRATES; NEAR-EDGE X-RAY ABSORPTION FINE STRUCTURE SPECTROSCOPIES; NEXAFS SPECTROSCOPY; PRIMARY AMINES; PROTONATED; SELF-ASSEMBLED; TERMINAL AMINO GROUPS; TERPHENYLS; THIOL MOLECULES; XPS; XPS DATA;

ABSORPTION SPECTROSCOPY; AMINATION; AMINES; AROMATIC COMPOUNDS; AROMATIZATION; ELECTRON ENERGY LEVELS; HYDROCARBONS; MOLECULAR ELECTRONICS; ORGANIC POLYMERS; PROPANE; SURFACE ANALYSIS; SURFACES; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

SELF ASSEMBLED MONOLAYERS;

EID: 77954267005     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3224     Document Type: Conference Paper

References (22)

1. J. C. Love, L. A. Estroff, J. K. Kriebel, R. G. Nuzzo, G. M. Whitesides, Chem. Rev. 2005, 105, 1103.
2. P. Cyganik, M. Buck, J. D. E. T. Wilton-Ely, C. Wöll, J. Phys. Chem. B 2005, 109, 10902.
3. N. Graf, E. Yegen, T. Gross, A. Lippitz, W. Weigel, S. Krakert, A. Terfort, W. E. S. Unger, Surf. Sci. 2009, 603, 2849.
4. H. Wang, S. F. Chen, L. Y. Li, S. Y. Jiang, Langmuir 2005, 21, 2633.
5. H. Wang, D. G. Castner, B. D. Ratner, S. Jiang, Langmuir 2004, 20, 1877.
6. L. Li, S. Chen, S. Jiang, Langmuir 2003, 19, 3266.
7. ISO 15472 : 2001, Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales., International Organization for Standardization, Geneva, Switzerland, 2001.
8. ISO 19318 : 2004, Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of methods used for charge control and charge correction, International Organization for Standardization, Geneva, Switzerland, 2004.
9. G. Beamson, D. Briggs, High Resolution XPS of Organic Polymers, Wiley: Chichester, 1992.
10. T. M. Willey, A. L. Vance, T. van Buuren, C. Bostedt, L. J. Terminello, C. S. Fadley, Surf. Sci. 2005, 576, 188.
11. J. Stöhr, NEXAFS Spectroscopy, Springer: Heidelberg, 1992.
12. P. E. Batson, Phys. Rev.B:Condens. MatterMater. Phys. 1993, 48, 2608.
13. S. Frey, V. Stadler, K. Heister, W. Eck, M. Zharnikov, M. Grunze, B. Zeysing, A. Terfort, Langmuir 2001, 17, 2408.
14. A. Shaporenko, M. Brunnbauer, A. Terfort, M. Grunze, M. Zharnikov, J. Phys. Chem. B 2004, 108, 14462.
15. A. Shaporenko, A. Terfort, M. Grunze, M. Zharnikov, J. Electron Spectrosc. Relat. Phenom. 2006, 151, 45.
16. J. E. Baio, T. Weidner, J. Brison, D. J. Graham, L. J. Gamble, D. G. Castner, J. Electron Spectrosc. Relat. Phenom. 2009, 172, 2.
17. M. Kinzler, A. Schertel, G. Hahner, C. Woll, M. Grunze, H. Albrecht, G. Holzhuter, T. Gerber, J. Chem. Phys. 1994, 100, 7722.
18. A. Patnaik, K. K. Okudaira, S. Kera, H. Setoyama, K. Mase, N. Ueno, J. Chem. Phys. 2005, 122, 154703 (1)-154703 (9).
19. A. G. Shard, J. D. Whittle, A. J. Beck, P. N. Brookes, N. A. Bullett, R. A. Talib, A. Mistry, D. Barton, S. L. McArthur, J. Phys. Chem. B 2004, 108, 12472.
20. O. Dhez, H. Ade, S. G. Urquhart, J. Electron Spectrosc. Relat. Phenom. 2003, 128, 85.
21. H.-T. Rong, S. Frey, Y.-J. Yang, M. Zharnikov, M. Buck, M. Wuhn, C. Wöll, G. Helmchen, Langmuir 2001, 17, 1582.
22. P. M. Dietrich, N. Graf, T. Gross, A. Lippitz, B. Schüpbach, A. Bashir, C. Wöll, A. Terfort, W. E. S. Unger, Langmuir 2010, (in press). DOI: 10.1021/la903293b.