SIMS fingerprint analysis on organic substrates

Surface and Interface Analysis

Volumn 42, Issue 6-7, 2010, Pages 826-829

  Hinder, Steven J ^a   Watts, John F ^a  

^a UNIVERSITY OF SURREY   (United Kingdom)

Author keywords

Fingerprint analysis; Fingerprint minutiae; Imaging SIMS; Time of flight secondary ion mass spectrometry

Indexed keywords

BIOMEDICAL APPLICATIONS; FINGERPRINT ANALYSIS; FINGERPRINT IMAGES; HIGH RESOLUTION; INDUSTRIAL LUBRICANTS; INORGANIC SURFACES; LATENT FINGERPRINT; LOW RESOLUTION; MODEL SUBSTRATES; ORGANIC SUBSTRATE; ORGANIC SURFACES; PERSONAL CARE PRODUCTS; POLYMERIC COATINGS; SI WAFER; SIMS IMAGING; SUBSTRATE MATERIAL; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; TOF SIMS;

BIOMETRICS; LUBRICANTS; SECONDARY EMISSION; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; SPECTROMETRY; SUBSTRATES;

SECONDARY ION MASS SPECTROMETRY;

EID: 77954266944     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3497     Document Type: Conference Paper

References (2)

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2. N. Archer, Y. Charles, J. Elliott, S. Jickells, Forensic Sci. Int. 2005, 154, 224.