Preliminary studies using imaging mass spectrometry TOF-SIMS in detection and analysis of fingerprints

Imaging Science Journal

Volumn 55, Issue 3, 2007, Pages 180-187

  Szynkowska, M I ^a   Czerski, K ^a   Grams, J ^a   Paryjczak, T ^a   Parczewski, A ^b,c  

^a LODZ UNIVERSITY OF TECHNOLOGY   (Poland)

^b INSTITUTE OF FORENSIC RESEARCH   (Poland)

^c JAGIELLONIAN UNIVERSITY   (Poland)

Author keywords

Fingerprints; Images; Time of flight secondary ion mass spectrometry (TOF SIMS)

Indexed keywords

EID: 35348929353     PISSN: 13682199     EISSN: None     Source Type: Journal    
DOI: 10.1179/174313107X177657     Document Type: Article

References (14)

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