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Volumn 42, Issue 6-7, 2010, Pages 588-591
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Oxide-film growth kinetics on Zr(0001) and Zr(1010) single-crystal surfaces
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Author keywords
Ellipsometry; Growth kinetics; Oxidation; Single crystalline metal surfaces; Zr
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Indexed keywords
IN-SITU;
ION SPUTTERING;
PARTIAL OXYGEN PRESSURES;
SINGLE-CRYSTALLINE;
SINGLE-CRYSTALLINE METAL SURFACES;
TEMPERATURE RANGE;
ULTRAHIGH VACUUM CONDITIONS;
BIOACTIVITY;
CRYSTALLINE MATERIALS;
GROWTH KINETICS;
OXIDATION;
OXIDE FILMS;
OXYGEN;
SINGLE CRYSTAL SURFACES;
SPECTROSCOPIC ELLIPSOMETRY;
SPUTTERING;
VACUUM;
ZIRCONIUM;
FILM GROWTH;
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EID: 77954262323
PISSN: 01422421
EISSN: 10969918
Source Type: Journal
DOI: 10.1002/sia.3235 Document Type: Conference Paper |
Times cited : (15)
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References (12)
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