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Volumn 42, Issue 6-7, 2010, Pages 588-591

Oxide-film growth kinetics on Zr(0001) and Zr(1010) single-crystal surfaces

Author keywords

Ellipsometry; Growth kinetics; Oxidation; Single crystalline metal surfaces; Zr

Indexed keywords

IN-SITU; ION SPUTTERING; PARTIAL OXYGEN PRESSURES; SINGLE-CRYSTALLINE; SINGLE-CRYSTALLINE METAL SURFACES; TEMPERATURE RANGE; ULTRAHIGH VACUUM CONDITIONS;

EID: 77954262323     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3235     Document Type: Conference Paper
Times cited : (15)

References (12)
  • 6
    • 0020175512 scopus 로고
    • 1983, 115, 110
    • R.A. Ploc, J. Nucl.Mater. 1982 110, 59, 1983, 115, 110.
    • (1982) J. Nucl. Mater. , vol.110 , pp. 59
    • Ploc, R.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.