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Volumn 322, Issue 19, 2010, Pages 2915-2921

Magnetism at spinel thin film interfaces probed through soft X-ray spectroscopy techniques

Author keywords

Proximity induced magnetism; Spinel thin films; X ray absorption spectroscopy; X ray magnetic circular dichroism

Indexed keywords

AMBIENT TEMPERATURES; BI-LAYER; ELEMENT SPECIFIC; HETEROSTRUCTURES; INDUCED MAGNETISM; INTERFACE REGIONS; ISOSTRUCTURAL; LONG RANGE MAGNETIC ORDER; MAGNETIC ORDERS; MICROSCOPY TECHNIQUE; PROXIMITY-INDUCED MAGNETISM; SOFT X-RAY; SPIN-POLARIZED; SPINEL PHASE; THIN FILM INTERFACES; X-RAY MAGNETIC CIRCULAR DICHROISM;

EID: 77954219575     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2010.05.005     Document Type: Article
Times cited : (13)

References (38)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.