Structural study by X-ray diffraction and transmission electron microscopy of the misfit compound (SbS1-xSex)1.16(Nb 1.036S2)2

Materials Research Bulletin

Volumn 45, Issue 8, 2010, Pages 982-988

  Kars, Mohammed ^a   Fredrickson, Daniel C ^b   Gomez Herrero A ^c   Lidin, Sven ^b   Rebbah, Allaoua ^a   Otero Diaz L C ^c  

^a UNIVERSITY OF SCIENCES AND TECHNOLOGY HOUARI BOUMEDIENE   (Algeria)

^b STOCKHOLM UNIVERSITY   (Sweden)

^c UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

Author keywords

Crystal growth; Crystal structure; Electron microscopy; Layered compound; X ray diffraction

Indexed keywords

COMPOSITE CRYSTAL; DIFFUSE SCATTERING; EDGE SHARING; EXTENDED DEFECT; LATTICE PARAMETERS; LAYERED COMPOUND; MISFIT COMPOUND; MISFIT-LAYER COMPOUNDS; SINGLE CRYSTAL X-RAY DIFFRACTION; SQUARE PYRAMID; STRUCTURAL STUDIES; STRUCTURE TYPE; SUB-LATTICES; TEM; THICK LAYERS; TRIGONAL PRISMS; TYPE STRUCTURES;

ANTIMONY COMPOUNDS; CRYSTAL GROWTH; CRYSTALLIZATION; ELECTRONS; GRAIN BOUNDARIES; NIOBIUM COMPOUNDS; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; SODIUM CHLORIDE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAYS;

CRYSTAL ATOMIC STRUCTURE;

EID: 77954217315     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2010.04.011     Document Type: Article

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