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Volumn 8, Issue SUPPL. 2, 2002, Pages 310-311
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Electron microscopy study of misfit layer structures in the Sb-Nb-S and Bi-Nb-S systems
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0036413520
PISSN: 14319276
EISSN: None
Source Type: Journal
DOI: 10.1017/s1431927602101073 Document Type: Conference Paper |
Times cited : (1)
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References (5)
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