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Journal of Electron Spectroscopy and Related Phenomena

Volumn 180, Issue 1-3, 2010, Pages 6-13

Description and performance of an electron-ion coincidence TOF spectrometer used at the Brazilian synchrotron facility LNLS

(11) Burmeister, F a,b Coutinho, L H a,e Marinho, R R T a Homem, M G P c De Morais, M A A d Mocellin, A d Bjorneholm O b Sorensen, S L f Fonseca, P T a Lindgren, A f Naves De Brito, A a,d

a LABORATÓRIO NACIONAL DE LUZ SÍNCROTRON (Brazil)

b UPPSALA UNIVERSITY (Sweden)

c FEDERAL UNIVERSITY OF SÃO CARLOS (Brazil)

d UNIVERSITY OF BRASILIA (Brazil)

e UNIVERSITY OF CAMPINAS (Brazil)

f LUND UNIVERSITY (Sweden)

Author keywords

Instrumentation; Multicoincidence; Synchrotron; Time of Flight

Indexed keywords

ANGULAR DISCRIMINATION; CHARGE-TO-MASS RATIOS; CHARGED CATIONS; COINCIDENCE MEASUREMENT; DETECTION EFFICIENCY; ELECTRON IONS; EXCITATION BEAMS; GASPHASE; INSTRUMENTATION; INTERACTION REGION; LENS PERFORMANCE; MOLECULAR NITROGEN; MULTI-COINCIDENCE; MULTI-HIT; NITROGEN ATOM; PHOTOELECTRON-PHOTOION-PHOTOION COINCIDENCES; POLARIZATION VECTORS; ROTARY VACUUM; SINGLE ION; SMALL-DIAMETER; SYSTEMATIC STUDY; TIME OF FLIGHT; TIME-OF-FLIGHT MASS SPECTROMETERS;

ELECTRONS; IONS; LENSES; MASS SPECTROMETERS; MASS SPECTROMETRY; OPTICAL INSTRUMENTS; PHOTOEXCITATION; PHOTONS; SYNCHROTRONS;

MEASUREMENTS;

EID: 77954215200 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/j.elspec.2010.02.007 Document Type: Article

Times cited : (47)

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