New coincidence techniques to study valence double photoionization

Journal of Electron Spectroscopy and Related Phenomena

Volumn 112, Issue 1-3, 2000, Pages 1-8

  Eland, John H D ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON DISULFIDE; CARBON MONOXIDE; ELECTRIC FIELD EFFECTS; IONIZATION OF GASES; KRYPTON; OXYGEN; PHOTONS;

PHOTOELECTRON-PHOTOION COINCIDENCE (PEPICO) TECHNIQUE;

PHOTOIONIZATION;

EID: 0034324546     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0368-2048(00)00199-7     Document Type: Article

References (23)

1. Schmidt V. Rep. Prog. Phys. 55:1992;1483.
2. Lablanquie P. J. Electron Spectrosc. Relat. Phenom. 76:1995;63.
3. Hsieh S., Eland J.H.D. J. Phys. B: At. Mol. Opt. Phys. 29:1996;5795.
4. Price S.D., Eland J.H.D. J. Phys. B: At. Mol. Opt. Phys. 23:1990;2269.
5. Eland J.H.D., Lablanquie P., Lavollée M., Simon M., Hall R.I., Hochlaf M., Penent F. J. Phys. B: At. Mol. Opt. Phys. 30:1997;2177.
6. Becker U., Hemmers O., Langer B., Menzel A., Wehlitz R., Peatman W.B. Phys. Rev. A45:1992;1295.
7. Hsieh S., Eland J.H.D. J. Phys. B: At. Mol. Opt. Phys. 30:1997;4515.
8. Lablanquie P., Lavollée M., Eland J.H.D., Penent F., Hall R.I. Measur. Sci. Technol. 7:1995;939.
9. Hochlaf M., Kjeldsen H., Penent F., Hall R.I., Lablanquie P., Lavollée M., Eland J.H.D. Can. J. Phys. 74:1996;856.
10. Field T.A., Eland J.H.D. Measur. Sci. Technol. 9:1998;922.
11. Becker U., Wehlitz R., Hemmers O., Langer B., Menzel A. Phys. Rev. Lett. 63:1989;1054.
12. Price S.D., Eland J.H.D. J. Phys. B: At. Mol. Opt. Phys. 24:1991;4379.
13. Field T.A., Eland J.H.D. Chem. Phys. Lett. 303:1999;144.
14. Field T.A., Eland J.H.D. Int. J. Mass Spectrom. 192:1999;281.
15. Kinmond E., Eland J.H.D., Karlsson L. Int. J. Mass Spectrom. 185:1999;437.
16. Lablanquie P., Nenner I., Millie P., Morin P., Eland J.H.D., Hubin-Franskin M.-J., Delwiche J. J. Chem. Phys. 82:1985;2951.
17. Hochlaf M., Chambaud G., Rosmus P. J. Chem. Phys. 108:1998;4047.
18. Lablanquie P., Delwiche J., Hubin-Franskin M.-J., Nenner I., Morin P., Ito K., Eland J.H.D., Robbe J.M., Gandara G., Fournier J., Fournier P.G. Phys. Rev. A40:1989;5673.
19. Liu Z.F., Bancroft G.M., Coatsworth L.L., Tan K.H. Chem. Phys. Lett. 203:1993;337.
20. Hall R.I., McConkey A., Ellis K., Dawber G., MacDonald M.A., King G.C. J. Phys. B: At. Mol. Opt. Phys. 25:1992;799.
21. Huetz A., Selles P., Waymel D., Mazeau J. J. Phys. B: At. Mol. Opt. Phys. 24:1991;1917.
22. Hall R.I., Dawber G., McConkey A., MacDonald M.A., King G.C. Phys. Rev. Lett. 68:1992;2751.
23. Lablanquie P., Eland J.H.D., Hall R.I., Penent F. J. Japan Soc. Synchrotron Res. 12:1999;286.