Triboelectrification studies of skin and skin cream using Kelvin probe microscopy

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 28, Issue 4, 2010, Pages 1018-1028

  Tang, Wei ^a,b   Bhushan, Bharat ^a   Ge, Shirong ^b  

^a OHIO STATE UNIVERSITY   (United States)

^b CHINA UNIVERSITY OF MINING AND TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; CHARGE BUILDUP; CHARGING MECHANISM; KELVIN PROBE MICROSCOPY; MACRO SCALE; MICRO-SCALES; NORMAL LOADS; POLYSTYRENE MICRO-SPHERE; SKIN CARE; SKIN CREAMS; SKIN SURFACES; STATIC CHARGE; TRIBOELECTRIFICATION;

POLYSTYRENES; PROBES; SURFACE PROPERTIES;

SURFACE POTENTIAL;

EID: 77954187626     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.3374341     Document Type: Conference Paper

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