Direct phase probing and mapping via spintronic michelson interferometry

Physical Review Letters

Volumn 105, Issue 1, 2010, Pages

  Wirthmann, A ^a   Fan, Xiaolong ^a,b   Gui, Y S ^a   Martens, K ^a   Williams, G ^a   Dietrich, J ^a   Bridges, G E ^a   Hu, C M ^a  

^a UNIVERSITY OF MANITOBA   (Canada)

^b LANZHOU UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

COHERENT MIXING; CROSS-DISCIPLINARY; MICHELSON INTERFEROMETRY; MICROWAVE IMAGING; NEAR-FIELD; ON CHIPS; PHASE-ONLY; RELATIVE PHASE; SPINTRONICS;

CEMENTS; ELECTROMAGNETIC WAVE DIFFRACTION; ELECTROMAGNETIC WAVE SCATTERING; ELECTROMAGNETIC WAVES; ELECTROMAGNETISM; FOUR WAVE MIXING; INTERFEROMETRY; MAGNETIC MATERIALS; MICHELSON INTERFEROMETERS; RESONANCE; WAVELET TRANSFORMS;

SPIN DYNAMICS;

EID: 77954092245     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.105.017202     Document Type: Article

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