Measuring properties of molecular surfaces using ray casting

Proceedings of the 2010 IEEE International Symposium on Parallel and Distributed Processing, Workshops and Phd Forum, IPDPSW 2010

Volumn , Issue , 2010, Pages

  Phillips, Mike ^a,b   Georgiev, Iliyan ^b   Dehof, Anna Katharina ^b   Nickels, Stefan ^b   Marsalek, Lukas ^b   Lenhof, Hans Peter ^b   Hildebrandt, Andreas ^b   Slusallek, Philipp ^a,b  

^a GERMAN RESEARCH CENTER FOR ARTIFICIAL INTELLIGENCE DFKI   (Germany)

^b SAARLAND UNIVERSITY   (Germany)

Author keywords

Ray tracing; Surface area; Volume

Indexed keywords

GEOMETRIC PROPERTIES; INTERNAL CAVITIES; MOLECULAR SURFACES; RAY CASTING; SURFACE AREA;

ELEMENTARY PARTICLE SOURCES;

DISTRIBUTED PARAMETER NETWORKS;

EID: 77954077784     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IPDPSW.2010.5470898     Document Type: Conference Paper

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