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Applied Physics Letters

Volumn 96, Issue 25, 2010, Pages

Electrostatic charge accumulation versus electrochemical doping in SrTiO3 electric double layer transistors

(4) Ueno, K a Shimotani, H b Iwasa, Y b,c Kawasaki, M a,c,d

a TOHOKU UNIVERSITY (Japan)

b UNIVERSITY OF TOKYO (Japan)

c JAPAN SCIENCE AND TECHNOLOGY AGENCY (Japan)

d TOHOKU UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT FORMATION; ELECTRIC DOUBLE LAYER; ELECTROCHEMICAL DOPING; ELECTROCHEMICAL PROCESS; ELECTROCHEMICAL REACTIONS; ELECTROSTATIC CHARGES; ELECTROSTATIC PROCESS; GATE BIAS; SHEET CHARGES; SRTIO;

ELECTRIC FIELD EFFECTS; ELECTRIC FURNACES; ELECTROCHEMISTRY; ELECTRON MOBILITY; ELECTROSTATICS; STRONTIUM ALLOYS;

SINGLE CRYSTALS;

EID: 77954068868 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3457785 Document Type: Article

Times cited : (87)

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