Sample-less calibration of the differential interference contrast microscope

Applied Optics

Volumn 49, Issue 15, 2010, Pages 2954-2968

  Mehta, Shalin B ^a   Sheppard, Colin J R ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; MICROSCOPES;

BACK FOCAL PLANES; DIC MICROSCOPES; DIFFERENTIAL INTERFERENCE CONTRAST MICROSCOPES; INTERFERENCE FRINGE; MEASUREMENTS OF; OPTICAL SET-UP;

IMAGE ANALYSIS;

ALGORITHM; ARTICLE; CALIBRATION; COMPUTER AIDED DESIGN; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; INTERFEROMETRY; METHODOLOGY; PHASE CONTRAST MICROSCOPY; REPRODUCIBILITY; SAMPLE SIZE; SENSITIVITY AND SPECIFICITY;

ALGORITHMS; CALIBRATION; COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; INTERFEROMETRY; MICROSCOPY, PHASE-CONTRAST; REPRODUCIBILITY OF RESULTS; SAMPLE SIZE; SENSITIVITY AND SPECIFICITY;

EID: 77954037929     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.49.002954     Document Type: Article

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