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Volumn 58, Issue 14, 2010, Pages 4629-4638

Constraint-dependent twin variant distribution in Ni2MnGa single crystal, polycrystals and thin film: An EBSD study

Author keywords

Electron backscattering diffraction (EBSD); Magnetic force microscopy (MFM); Martensitic phase transformation; Ni Mn Ga; Twinning

Indexed keywords

COMPREHENSIVE STUDIES; ELECTRON BACKSCATTERING DIFFRACTION; ELECTRON BACKSCATTERING DIFFRACTION (EBSD); EPITAXIAL THIN FILMS; INDUCED STRAIN; MAGNETIC SHAPE MEMORY ALLOYS; MARTENSITIC PHASE TRANSFORMATIONS; NI-MN-GA; POLYCRYSTALLINE; SINGLE-CRYSTALLINE; THREE-DIMENSIONAL ORIENTATION; TWIN BOUNDARY MOTION; TWIN PLANES; UNIT CELLS;

EID: 77953870089     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2010.04.030     Document Type: Article
Times cited : (47)

References (25)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.