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Volumn 58, Issue 14, 2010, Pages 4629-4638
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Constraint-dependent twin variant distribution in Ni2MnGa single crystal, polycrystals and thin film: An EBSD study
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Author keywords
Electron backscattering diffraction (EBSD); Magnetic force microscopy (MFM); Martensitic phase transformation; Ni Mn Ga; Twinning
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Indexed keywords
COMPREHENSIVE STUDIES;
ELECTRON BACKSCATTERING DIFFRACTION;
ELECTRON BACKSCATTERING DIFFRACTION (EBSD);
EPITAXIAL THIN FILMS;
INDUCED STRAIN;
MAGNETIC SHAPE MEMORY ALLOYS;
MARTENSITIC PHASE TRANSFORMATIONS;
NI-MN-GA;
POLYCRYSTALLINE;
SINGLE-CRYSTALLINE;
THREE-DIMENSIONAL ORIENTATION;
TWIN BOUNDARY MOTION;
TWIN PLANES;
UNIT CELLS;
BACKSCATTERING;
ELECTRON SCATTERING;
GALLIUM;
GALLIUM ALLOYS;
GRAIN BOUNDARIES;
MAGNETIC DOMAINS;
MAGNETIC MATERIALS;
MANGANESE;
MANGANESE COMPOUNDS;
MARTENSITE;
MARTENSITIC TRANSFORMATIONS;
POLYCRYSTALS;
SINGLE CRYSTALS;
THIN FILMS;
MAGNETIC FORCE MICROSCOPY;
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EID: 77953870089
PISSN: 13596454
EISSN: None
Source Type: Journal
DOI: 10.1016/j.actamat.2010.04.030 Document Type: Article |
Times cited : (47)
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References (25)
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