X-ray photoelectron spectroscopy investigation of Cu xS and Tl xS layers on the polyamide flm surface formed with the use of dodecathionic acid

Chemija

Volumn 20, Issue 1, 2009, Pages 38-44

  Janickis, Vitalijus ^a   Ancutiene, Ingrida ^a   Stokiene, Ruta ^a  

^a KAUNAS UNIVERSITY OF TECHNOLOGY   (Lithuania)

Author keywords

Cu xS and Tl xS layers; Polyamide; X ray photoelectron spectroscopy

Indexed keywords

EID: 77953868982     PISSN: 02357216     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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