Comparative study of optical parameters of fullerene C60 film at different temperatures

Optics Communications

Volumn 283, Issue 18, 2010, Pages 3437-3440

  Qaiser, Darakhshan ^a   Khan, Mohd Shahid ^a   Singh, R D ^a   Khan, Zahid H ^a  

^a JAMIA MILLIA ISLAMIA CENTRAL UNIVERSITY   (India)

Author keywords

Band gap; Fullerene C60; SEM; XRD

Indexed keywords

BAND GAPS; COMPARATIVE STUDIES; DISLOCATION DENSITIES; FULLERENE C; GLASS SUBSTRATES; GRAIN SIZE; LIQUID NITROGEN TEMPERATURE; LOW TEMPERATURES; OPTICAL PARAMETER; PER UNIT; ROOM TEMPERATURE; SCANNING ELECTRON MICROSCOPES; SEM; SPECTRAL RANGE; THERMAL EVAPORATION TECHNIQUE; UV-VIS SPECTROPHOTOMETERS; XRD;

CRYSTALLITE SIZE; ENERGY GAP; FULLERENES; LIQUID NITROGEN; MORPHOLOGY; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; SURFACE MORPHOLOGY; THERMAL EVAPORATION;

OPTICAL FILMS;

EID: 77953651609     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2010.04.058     Document Type: Article

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