Structural and optical properties of electron beam evaporated CdSe thin films

Bulletin of Materials Science

Volumn 30, Issue 6, 2007, Pages 547-551

  Suthan Kissinger, N J ^a   Jayachandran, M ^b   Perumal, K ^c   Sanjeevi Raja, C ^d  

^a NESAMONY MEMORIAL CHRISTIAN COLLEGE   (India)

^b CENTRAL ELECTROCHEMICAL RESEARCH INSTITUTE   (India)

^c Vidyalaya College of Arts and Science   (India)

^d ALAGAPPA UNIVERSITY   (India)

Author keywords

CdSe films; Electron beam evaporation; Energy band gap; Structural properties

Indexed keywords

ELECTRON ABSORPTION; ENERGY GAP; MECHANICAL STABILITY; OPTICAL PROPERTIES; OPTOELECTRONIC DEVICES; SOLAR ENERGY; THIN FILMS; X RAY DIFFRACTION;

CDSE FILMS; ELECTRON BEAM EVAPORATION; ENERGY BAND GAP;

CADMIUM COMPOUNDS;

EID: 37749038964     PISSN: 02504707     EISSN: None     Source Type: Journal    
DOI: 10.1007/s12034-007-0085-7     Document Type: Article

References (19)

1. De C K and Mishra N K 1997 Indian J. Phys. 71 530
2. Elango T, Subramanian V and Murali K R 2000 Surf. Coat. Technol. 123 8
3. Fortin B, Larzul H, Lebigot J, Raoult F and Rosse G 1985 Electron. Opt. 131 51
4. Ghosh S, Mukherjee A, Kim H and Lie C 2003 Mater. Chem. Phys. 78 726
5. Hodes G 1980 Nature 285 29
6. JCPDS files No. 08-459 and 19-191
7. Kainthla R C, Pandya D K and Chopra K L 1980 J. Electrochem. Soc. 127 277
8. Kale R B and Lokhande C D 2004 Appl. Surf. Sci. 223 343
9. Mahmoud A H 1990 Cryst. Res. Technol. 25 1147
10. Miyake K, Kaneko H, Sano M and Suedomi N 1984 J. Appl. Phys. 55 2747
11. Murali K R, Subramanian V, Rangarajan N, Lakshmanan A S and Rangarajan S K 1993 Bull. Electrochem. 9 209
12. Richter H 1988 20th IEEE photovoltaics specialists conf. (New York: IEEE) p. 1537
13. Roth M 1989 Nucl. Instrum. Methods A283 291
14. Samanta D, Samanta B, Chaudhuri A K, Ghorai S and Pal U 1996 Semicond. Sci. Technol. 11 548
15. Sarma H P, Rangarajan N and Murali KR 1993 Phys. Status Solidi A148 209
16. Savadago O and Mandal K C 1992 Mater. Chem. Phys. 31 301
17. Smyntyna V A, Gersutenko V, Sashulis S, Mattogno G and Reghini S 1994 Sensors & Actuators B18 464
18. Van Calster A, Vervaet A, DeRycke I, De Baets J and Vanfleteren J 1988 J. Cryst. Growth 86 924
19. Wilson AP J 1963 Mathematical theory of X-ray powder diffractometry (New York: Gordon and Breach) p. 62