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Volumn 107, Issue 11, 2010, Pages

Direct observation of electronic inhomogeneities induced by point defect disorder in manganite films

(10) Sirena, M a Zimmers, A c Haberkorn, N a Kaul, E a Steren, L B b Lesueur, J c Wolf, T c Le Gall, Y d Grob, J J d Faini, G e

a INSTITUTO BALSEIRO (Argentina)

b CENTRO ATÓMICO CONSTITUYENTES (Argentina)

c Centre National de la Recherche Scientifique (France)

d Faculté de Médecine (France)

e UNIV PARIS SUD (France)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE ATOMIC FORCE MICROSCOPY; DIRECT OBSERVATION; INHOMOGENEITIES; IRRADIATED SAMPLES; IRRADIATION DOSE; MANGANITE FILMS; REAL-TIME MAPPING; SPATIAL FLUCTUATION;

ATOMIC FORCE MICROSCOPY; DEFECTS; ELECTRONIC PROPERTIES; MANGANESE OXIDE; METAL INSULATOR BOUNDARIES; OXIDE MINERALS; POINT DEFECTS; SATURATION MAGNETIZATION; SEMICONDUCTOR INSULATOR BOUNDARIES; TRANSPORT PROPERTIES;

METAL INSULATOR TRANSITION;

EID: 77953630984 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3428458 Document Type: Article

Times cited : (5)

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