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Volumn 96, Issue 22, 2010, Pages

Silicon surface passivation by an organic overlayer of 9,10- phenanthrenequinone

Author keywords

[No Author keywords available]

Indexed keywords

HIGH QUALITY; INVERSION LAYER; LOW-TEMPERATURE PROCESS; ORGANIC MOLECULES; ORGANIC SEMICONDUCTOR; PHENANTHRENEQUINONE; RECOMBINATION VELOCITY; SILICON (100); SILICON HETEROJUNCTIONS; SILICON INTERFACE; SILICON SURFACES;

EID: 77953567225     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3429585     Document Type: Article
Times cited : (41)

References (16)
  • 5
    • 34848921732 scopus 로고    scopus 로고
    • Polyaniline on crystalline silicon heterojunction solar cells
    • DOI 10.1063/1.2789785
    • W. Wang and E. A. Schiff, Appl. Phys. Lett. APPLAB 0003-6951 91, 133504 (2007). 10.1063/1.2789785 (Pubitemid 47502624)
    • (2007) Applied Physics Letters , vol.91 , Issue.13 , pp. 133504
    • Wang, W.1    Schiff, E.A.2
  • 7
    • 0037055608 scopus 로고    scopus 로고
    • Formation of π-conjugated molecular arrays on silicon (0 0 1) surfaces by heteroatomic Diels-Alder chemistry
    • DOI 10.1016/S0039-6028(02)01654-0, PII S0039602802016540
    • L. Fang, J. Liu, S. Coulter, X. Cao, M. P. Schwartz, C. Hacker, and R. J. Hamers, Surf. Sci. SUSCAS 0039-6028 514, 362 (2002). 10.1016/S0039-6028(02) 01654-0 (Pubitemid 34822305)
    • (2002) Surface Science , vol.514 , Issue.1-3 , pp. 362-375
    • Fang, L.1    Liu, J.2    Coulter, S.3    Cao, X.4    Schwartz, M.P.5    Hacker, C.6    Hamers, R.J.7
  • 9
    • 77953579836 scopus 로고    scopus 로고
    • Lifetimes were measured by quasisteady-state photoconductance (QSSPC) method using a commercial instrument (WCT-120) manufactured by Sinton Consulting, Boulder, CO
    • Lifetimes were measured by quasisteady-state photoconductance (QSSPC) method using a commercial instrument (WCT-120) manufactured by Sinton Consulting, Boulder, CO.
  • 11
    • 77953548483 scopus 로고    scopus 로고
    • See supplementary material at E-APPLAB-96-003020 for graphs of effective lifetime versus minority carrier densities
    • See supplementary material at http://dx.doi.org/10.1063/1.3429585 E-APPLAB-96-003020 for graphs of effective lifetime versus minority carrier densities.
  • 12
    • 0030781795 scopus 로고    scopus 로고
    • IETDAI 0018-9383,. 10.1109/16.554806
    • D. Schroder, IEEE Trans. Electron Devices IETDAI 0018-9383 44, 160 (1997). 10.1109/16.554806
    • (1997) IEEE Trans. Electron Devices , vol.44 , pp. 160
    • Schroder, D.1
  • 13
    • 0000612857 scopus 로고    scopus 로고
    • JAPIAU 0021-8979,. 10.1063/1.371633
    • H. Nagel, C. Berge, and A. G. Aberle, J. Appl. Phys. JAPIAU 0021-8979 86, 6218 (1999). 10.1063/1.371633
    • (1999) J. Appl. Phys. , vol.86 , pp. 6218
    • Nagel, H.1    Berge, C.2    Aberle, A.G.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.