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Volumn , Issue , 2006, Pages 590-595

Thermal analysis of a molded case circuit breaker -effect of electric contact resistance and bimetal design

Author keywords

Circuit breaker; Contact erosion; Finite difference thermal analysis; Silver tungsten; Thermostatic bimetal

Indexed keywords

ARC EROSION; CONTACT EROSION; CONTACT FORCES; CONTACT INTERFACE; HEAT GENERATING COMPONENTS; INPUT DATAS; MOLDED CASE CIRCUIT BREAKERS; TEMPERATURE RISE;

EID: 77953523082     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (13)
  • 1
    • 84890421089 scopus 로고
    • Thermal Modeling of Electrical Contacts in Switches and Relays
    • C. Leung, A. Lee & B. Wang, "Thermal Modeling of Electrical Contacts in Switches and Relays," 41st IEEE Holm Conference, 1995.
    • (1995) 41st IEEE Holm Conference
    • Leung, C.1    Lee, A.2    Wang, B.3
  • 4
    • 16244404982 scopus 로고    scopus 로고
    • Optimal Design of Generator Circuit Breakers up to a Capacity of 2000MVA using Thermal Models
    • T. Schoenemann, M. Pleines, M. Schenk, H. Lobl, T. Magier, "Optimal Design of Generator Circuit Breakers up to a Capacity of 2000MVA using Thermal Models," 50th IEEE Holm Conference, 2004, p 111-117.
    • (2004) 50th IEEE Holm Conference , pp. 111-117
    • Schoenemann, T.1    Pleines, M.2    Schenk, M.3    Lobl, H.4    Magier, T.5
  • 5
    • 21044442560 scopus 로고    scopus 로고
    • Four Decades of Research on Thermal Contact, Gap and Joint Resistance in Microelectronics
    • June
    • M. M. Yovanovich, "Four Decades of Research on Thermal Contact, Gap and Joint Resistance in Microelectronics," Trans. CPMT, vol. 28, no. 2, June 2005, p182-206.
    • (2005) Trans. CPMT , vol.28 , Issue.2
    • Yovanovich, M.M.1
  • 6
    • 0020716709 scopus 로고
    • A Comparison of Ag/W, Ag/WC and Ag/Mo electrical Contacts
    • March
    • C. Leung, & H. Kim, "A Comparison of Ag/W, Ag/WC and Ag/Mo electrical Contacts," IEEE Trans. CHMT, vo. CHMT-7, No. 1, March 1984, p69-75.
    • (1984) IEEE Trans. CHMT , vol.CHMT-7
    • Leung, C.1    Kim, H.2
  • 7
    • 84890373043 scopus 로고    scopus 로고
    • Erosion and Resistance Characteristics of AgW and AgC Contacts at High Current Arcing in Air
    • J. Shea, "Erosion and Resistance Characteristics of AgW and AgC Contacts at High Current Arcing in Air," 44th IEEE Holm 1998.
    • (1998) 44th IEEE Holm
    • Shea, J.1
  • 8
    • 0025468030 scopus 로고
    • Contact Resistance Variations of Tungsten Contacts Operated in Air and Silver-Tungsten Carbide Contacts Operated in Vacuum
    • P. Slade & J. Bindas, "Contact Resistance Variations of Tungsten Contacts Operated in Air and Silver-Tungsten Carbide Contacts Operated in Vacuum," 36th IEEE Holm Conference, 1990, p530-537.
    • (1990) 36th IEEE Holm Conference
    • Slade, P.1    Bindas, J.2
  • 9
    • 84890377196 scopus 로고    scopus 로고
    • T/SNAP, Analytical Software Consultant, P.O. Box 2132, Hawthorne, CA
    • T/SNAP, Thermal System Network Analyzer Program, Analytical Software Consultant, P.O. Box 2132, Hawthorne, CA.
    • Thermal System Network Analyzer Program
  • 10
    • 0005748396 scopus 로고
    • Fundamental Studies of the Thermal Conductance of Metallic Contacts
    • H. Y. Wong, "Fundamental Studies of the Thermal Conductance of Metallic Contacts," Proc. 8th Conf. Thermal Conductivity, 1969, p495-511.
    • (1969) Proc. 8th Conf. Thermal Conductivity , pp. 495-511
    • Wong, H.Y.1
  • 11
    • 0036613773 scopus 로고    scopus 로고
    • Hierarchical Compact Models for Simulation of Electronic Chip Packages
    • June
    • D. Boyalakuntla and J. Murthy, "Hierarchical Compact Models for Simulation of Electronic Chip Packages," IEEE Trans. CPMT, vol.25, No.2, June 2002.
    • (2002) IEEE Trans. CPMT , vol.25 , Issue.2
    • Boyalakuntla, D.1    Murthy, J.2
  • 13
    • 33644807562 scopus 로고    scopus 로고
    • General Thermal Force Model with Experimental Studies
    • March
    • J. Lee, "General Thermal Force Model with Experimental Studies," IEEE Tran. CPT, vol.29, no. 1, March 2006, p 20-29.
    • (2006) IEEE Tran. CPT , vol.29 , Issue.1 , pp. 20-29
    • Lee, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.