Comparing fail-safe microcontroller architectures in light of IEC 61508

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 2007, Pages 123-131

  Mariani, Riccardo ^a   Fuhrmann, Peter ^b  

^a San Martino Ulmiano   (Italy)

^b PHILIPS RESEARCH LABORATORIES   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC SYSTEMS; IEC 61508; MICROCONTROLLER ARCHITECTURE; OPTIMIZED ARCHITECTURES; REFERENCE DESIGNS; SAFETY-RELATED;

AUTOMOBILE ELECTRONIC EQUIPMENT; DEFECTS; DESIGN FOR TESTABILITY; FAULT TOLERANCE; MICROCONTROLLERS;

ARCHITECTURE;

EID: 77953201520     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DFT.2007.63     Document Type: Conference Paper

References (16)

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