Fundamental importance of background analysis in precise characterization of single-walled carbon nanotubes by optical absorption spectroscopy

Journal of Physical Chemistry C

Volumn 114, Issue 22, 2010, Pages 10077-10081

  Ohmori, Shigekazu ^a   Saito, Takeshi ^a,b   Tange, Masayoshi ^a   Shukla, Bikau ^a   Okazaki, Toshiya ^a   Yumura, Motoo ^a   Iijima, Sumio ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYSIS METHOD; BACKGROUND ANALYSIS; BASELINE CORRECTION; CHIRALITY DISTRIBUTION; DECONVOLUTING; LINE SHAPE; LORENTZIAN LINE; OPTICAL ABSORPTION SPECTROSCOPY; PL SPECTROSCOPY; SEMICONDUCTIVE; SIMILAR ANALYSIS; UV ABSORPTION;

ABSORPTION; CARBON NANOTUBES; CENTRIFUGATION; CHARACTERIZATION; LIGHT ABSORPTION; SINGLE-WALLED CARBON NANOTUBES (SWCN); SPECTRUM ANALYSIS; STEREOCHEMISTRY;

ABSORPTION SPECTROSCOPY;

EID: 77953200018     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp9120172     Document Type: Article

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