Simulation of L X-ray yields induced by He ions

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 268, Issue 11-12, 2010, Pages 1802-1805

  Taborda, A ^a,b   Chaves, P C ^a,b,c   Reis, M A ^a,b  

^a INSTITUTO TECNOLÓGICO E NUCLEAR   (Portugal)

^b UNIVERSITY OF LISBON   (Portugal)

^c INSTITUTO SUPERIOR TÉCNICO   (Portugal)

Author keywords

Alpha particles; PIXE; Simulation; X rays

Indexed keywords

ARBITRARY SAMPLES; FUNDAMENTAL PARAMETERS; L X-RAYS; MATERIAL SCIENCE; MULTI-LAYERED TARGET; OPEN-SOURCE LIBRARIES; OTHER APPLICATIONS; X-RAY YIELD;

ALPHA PARTICLES; IONS;

X RAYS;

EID: 77953138944     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2010.02.078     Document Type: Article

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