A new low-loss dielectric using CaTiO3-modified (Mg0.95Mn0.05)TiO3 ceramics for microwave applications

Journal of Alloys and Compounds

Volumn 499, Issue 1, 2010, Pages 48-52

  Huang, Cheng Liang ^a   Chen, Jhih Yong ^a   Huang, Guan Sian ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

Crystal growth; Dielectric response

Indexed keywords

CERAMIC SYSTEMS; DIELECTRIC CONSTANTS; DIELECTRIC RESPONSE; EDX ANALYSIS; LOW LOSS; MATERIAL CANDIDATE; MATRIX; MICROWAVE APPLICATIONS; MICROWAVE DIELECTRIC MATERIALS; MICROWAVE DIELECTRIC PROPERTIES; MICROWAVE DIELECTRICS; MIXED OXIDE ROUTE; RESONANT FREQUENCIES; SEM; TIO; TWO PHASE SYSTEMS; XRD;

CERAMIC MATERIALS; CRYSTAL GROWTH; CRYSTALLIZATION; DIELECTRIC LOSSES; GRAIN BOUNDARIES; MANGANESE; MANGANESE COMPOUNDS; MICROWAVES; NATURAL FREQUENCIES; OXIDE MINERALS; PEROVSKITE;

DIELECTRIC MATERIALS;

EID: 77953134633     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2010.01.014     Document Type: Article

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