Low-loss microwave dielectrics using Mg2(Ti1-xSn x)O4 (x=0.01-0.09) solid solution

Journal of the American Ceramic Society

Volumn 92, Issue 10, 2009, Pages 2237-2241

  Huang, Cheng Liang ^a   Chen, Jhih Yong ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL FORMULAE; CONVENTIONAL MIXED OXIDE ROUTE; LATTICE PARAMETERS; LOW LOSS; MICROWAVE DIELECTRIC PROPERTIES; MICROWAVE DIELECTRICS; SECOND PHASE; ULTRA-HIGH; X-RAY POWDER DIFFRACTION PATTERN;

CERAMIC CAPACITORS; CERAMIC MATERIALS; CORUNDUM; CRYSTALLIZATION; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; DIFFRACTION; HOLOGRAPHIC INTERFEROMETRY; MICROWAVES; OXIDE MINERALS; SOLIDIFICATION; TIN; X RAY POWDER DIFFRACTION;

SOLID SOLUTIONS;

EID: 70349557989     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2009.03060.x     Document Type: Article

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